{"id":3955,"date":"2022-11-21T12:26:03","date_gmt":"2022-11-21T11:26:03","guid":{"rendered":"http:\/\/test.meodot.com\/?page_id=3955"},"modified":"2023-01-20T13:06:40","modified_gmt":"2023-01-20T12:06:40","slug":"technology","status":"publish","type":"page","link":"https:\/\/test.meodot.com\/?page_id=3955&lang=en","title":{"rendered":"Technology"},"content":{"rendered":"

Analytics<\/h3><\/div>

At meo. we have made it our goal to build a foundation with practical and theoretical knowledge. To reach new goals, we have therefore chosen the approach of science. Thanks to our own analytics, publications and research, we welcome any challenge.<\/p>\n<\/div><\/div><\/div><\/div><\/div>

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Preparatory measures<\/h4><\/div>
Sample preparation (Struers Secotom-50 and Tegramin\/ C- and Au-Coater):<\/h6><\/div>

Cutting, embedding, grinding, polishing, sputtering, (electrolytic) etching of samples as preparation for further metallographic investigations<\/p>\n<\/div><\/div><\/div>

Microwave digestion system (Berghof Speedwave 4):<\/h6><\/div>

Carrying out chemical digestions under extreme pressure and temperature conditions\u00a0<\/p>\n<\/div><\/div><\/div>

Ion polisher (Leica EM TIC020, slope etching system):<\/h6><\/div>

Produce high-quality, large-area cross-sections of virtually any material and thus precise, efficient target preparation of samples for SEM analysis\u00a0<\/p>\n<\/div><\/div><\/div>

Sputtering device:<\/h6><\/div>

Application of a gold layer to create a conductive surface by means of cathode sputtering to make non-conductive materials measurable for the SEM<\/p>\n<\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div>

Surface examinations and material composition<\/h4><\/div>
Reflected light microscope (Leica DM2500M).<\/h6><\/div>

Surface examinations in connection with the evaluation software ImageAccess (e.g. texture analysis, porosity determination, layer thickness measurement)<\/p>\n<\/div><\/div><\/div>

Profilometer (Keyence VR-3200):\u200b<\/h6><\/div>

Optical roughness measurement, dimensional control, comparison of the components with the 3D CAD design drawing<\/p>\n<\/div><\/div><\/div>

Contact angle measurement setup:<\/h6><\/div>

Measurement of the contact angle to determine the wettability<\/p>\n<\/div><\/div><\/div>

ICP \u2013 OES (Varian 720-ES):\u200b<\/h6><\/div>

Determination of the elemental composition of magnesium alloys by optical emission spectral analysis with inductively coupled plasma<\/p>\n<\/div><\/div><\/div><\/div><\/div><\/div>

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Scanning electron microscopy<\/h4><\/div>
Scanning electron microscope (SEM) (Philips FEI XL 30 CP).<\/h6><\/div>

Surface analysis by SE and BSE detector of organic and inorganic samples<\/p>\n

EDX analysis and mapping<\/p>\n

EBSD analysis and mapping<\/p>\n<\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div>

Mechanical test methods<\/h4><\/div>
Tensile \/ compression tester 10kN (Zwick\/Roell Z010):<\/h6><\/div>

Tensile and compression tests (e.g.: according to DIN EN ISO 6892-1) on metals and plastics, puncture tests on foils, bending tests<\/p>\n<\/div><\/div><\/div>

Micro hardness tester (Fischerscope H100):<\/h6><\/div>

Micro hardness test according to Vickers<\/p>\n<\/div><\/div><\/div>

Rotating bending test facility:<\/h6><\/div>

Fatigue test with bending stress on the running bar and generation of W\u00f6hler curves<\/p>\n<\/div><\/div><\/div>

Tribometer:\u200b<\/h6><\/div>

Measurement of tribological parameters such as friction and wear<\/p>\n<\/div><\/div><\/div><\/div><\/div><\/div>

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Final measures<\/h4><\/div>
Macro photography (Canon EOS 550D):<\/h6><\/div>

Creating macro images with the connection to the image editing programme ImageAccess<\/p>\n<\/div><\/div><\/div>

Laser marker (Keyence):<\/h6><\/div>

Marking of metal and plastic surfaces by means of laser beam<\/p>\n<\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div>

Publications<\/h3><\/div>

Here you will find all the important publications that we have published in recent years.<\/p>\n<\/div><\/div><\/div><\/div><\/div><\/div>